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2009 Quality & Productivity Research Conference

IBM T. J. Watson Research Ctr., Yorktown Heights, NY

June 3-5, 2009



Invited Paper Sessions (session dates and times can be found in the Program )

Opening Plenary Session
Session Organizer: Emmanuel Yashchin, IBM Research
Session Chair: Emmanuel Yashchin, IBM Research
1. Conference kick-off: Brenda Dietrich, IBM Fellow and VP, Business Analytics and Mathematical Science
2. "Process Transformation and Quality," Kathleen Smith, IBM VP Process Transformation and Quality
3. "Data Analytics in IBM: Opportunities and Challenges", Chidanand Apte, Manager of the Data Analytics Department, IBM Research.

1. Designing High Reliability Products
Session Organizer: Narendra Soman, General Electric Co.
Session Chair: Reinaldo Gonzalez, General Electric Co.
1. "Applications of Reliability Demonstration Tests," Winson Taam, Boeing Co.
2. "Reliability of advanced CMOS devices and circuits," James Stathis, IBM Research
3. "Statistical Reliability Modeling of Field Failures Works!" David C. Trindade, Sun Microsystems

2. Statistics for Business Analytics
Session Organizer: Ta-Hsin Li, IBM Research.
Session Chair: Ta-Hsin Li, IBM Research.
1. "Statistical Applications in Business Analytics," Yasuo Amemiya, IBM Research
2. "Forecasting Time Series of Inhomogeneous Poisson Processes With Application to Call Center Workforce Management," Haipeng Shen, U. North Carolina - Chapel Hill
3. "On the Existense of E-loyalty Networks in Ebay Auctions and Their Structure," Inbal Yahav and Wolfgang Jank, University of Maryland

3. Analytics and Risk Management
Session Organizer: Martha Gardner, General Electric Co.
Session Chair: Martha Gardner, General Electric Co.
1. "Post-Financial Meltdown; What Does the Financial Services Industry Need From Us?" Roger Hoerl, GE Global Research
2. "Model Risks in Financial Services Risk Modeling," Tim Keyes, Sr. VP, Risk Management, GE Commercial Finance
3. "Elicitation of Causal Network Diagrams for Risk Assessment," Bonnie Ray, IBM Research

4. Special Honoree Invited Session
Session Organizer: William Q. Meeker, Iowa State University
Session Chair: Paul Tobias (Sematech, Ret.)
1. "Proactive Product Servicing," Necip Doganaksoy, Gerald Hahn, General Electric Co. and William Q. Meeker, Iowa State University
2. "Accelerated Destructive Degradation Test Planning," Luis A. Escobar, Louisiana State University, Ying Shi and William Q. Meeker, Iowa State University
3. "A General Model and Data Analyses for Defect Initiation, Growth, and Failure," Wayne Nelson, Wayne Nelson Statistical Consulting Co.

5. Aspects of Bias, Prediction Variance and Mean Square Error
Session Organizer: Christine Anderson-Cook, Los Alamos National Laboratory
Session Chair: Nalini Ravishanker, University of Connecticut
1. "Construction and Evaluation of Response Surface Designs Incorporating Bias from Model Misspecification," Connie Borror (Arizona State University West), Christine M. Anderson-Cook (Los Alamos National Laboratory) and Bradley Jones, JMP SAS Institute
2. "Mean Squared Error in Model Selection," Adam Pintar (Iowa State University), Christine M. Anderson-Cook (Los Alamos National Laboratory) and Huaiqing Wu, Iowa State University
3. Discussion: Greg Piepel, Pacific Northwest National Laboratory

6. Semi-supervised Learning in Quality Control
Session Organizer: George Michailidis, University of Michigan
Session Chair: George Michailidis, University of Michigan
1. "Semi-supervised Regression with the Joint Trained Lasso," Mark Culp, West Virginia University
2. "High Dimensional Nonlinear Semi-supervised Learning," Tong Zhang, Rutgers University
3. "Data-dependent Kernels for Semi-supervised Learning," Vikas Sindhwani, IBM Research

7. Risk Analysis in Information Technology Industry
Session Organizer: Bonnie Ray, IBM Research.
Session Chair: Bonnie Ray, IBM Research.
1. "Human reliability analysis challenges in modeling operational risk," Tim Bedford, University of Strathclyde
2. "Adversarial Risk Analysis," David Banks, Duke University
3. "Modeling and Measuring Operational Process Risk," Eric Cope, IBM Zurich Research Lab

8. Sequential Testing
Session Organizer: Joseph Glaz, University of Connecticut
Session Chair: Joseph Glaz, University of Connecticut
1. "Repeated significance tests with random stopping," Vladimir Pozdnyakov, University of Connecticut
2. "An Introduction to a random sequential probability ratio test (RSPRT) with some data analysis," Nitis Mukhopadhyay, University of Connecticut
3. "Scan statistics with applications to quality control and reliability theory," Joseph Glaz, University of Connecticut

9. Lifetime Data Analysis
Session Organizer: Scott Kowalski, Minitab.
Session Chair: Scott Kowalski, Minitab.
1. "Issues in Designing and Analyzing Experiments for Life Time Data," Geoff Vining, Virginia Tech
2. "Multi-faceted Approach to Demonstrate Product Reliability," James Breneman, Pratt & Whitney Co.
3. "Control Charts for the Parameters of Life Time Data Distributions," Denisa Olteanu, Virginia Tech

10. Challenges in Web Search and Advertising
Session Organizer: Kishore Papineni, Yahoo Research.
Session Chair: Kishore Papineni, Yahoo Research.
1. "Contextual advertising: Challenges in matching ads to Web pages," Silviu-Petru Cucerzan, Microsoft Research
2. "Keeping a Search Engine Index Fresh: Risk versus Optimality Tradeoffs in Estimating Frequency of Change in Web Pages," Carrie Grimes, Google Research
3. "Challenges in allocating banner advertisements," Kishore Papineni, Yahoo Research

11. Classification models with applications to Quality
Session Organizer: Karel Kupka, TriloByte Statistical Software
Session Chair: Karel Kupka, TriloByte Statistical Software
1. "ROC curves as an aspect of classification," Jan Kolacek, University Brno, Czech Republic
2. "Automatic detection and classification of fabric defects," A. Linka, M. Tunak, P. Volf, Technical University Liberec, Czech Republic
3. "Data transformation in multivariate quality control," Jiri Militky, Technical University Liberec, Czech Republic
4. "Neural network time series classification of changes in nuclear power plant processes ," Karel Kupka, TriloByte Statistical Software

12. Advances in Statistical Process Control: Session in Honor of the late Professor Zachary Stoumbos
Session Organizer: Emmanuel Yashchin, IBM Research
Session Chair: Emmanuel Yashchin, IBM Research
1. "The Combined Chart Controversy," Douglas Hawkins, University of Minnesota
2. "The State of Statistical Process Control - An Update," William H. Woodall, Virginia Tech
3. "The Use of Sequential Sampling in Process Monitoring," Marion Reynolds, Virginia Tech

13. Reliability Assessment and Verification
Session Organizer: Gejza Dohnal, Czech Technical University, Czech Republic
Session Chair: Gejza Dohnal, Czech Technical University, Czech Republic
1. "Intensity models for randomly censored data," Ivanka Horova, Masaryk University Brno, Czech Republic
2. "Successive events modeling," Gejza Dohnal, Czech Technical University, Czech Republic
3. "Quality and Risk: Convergence and Perspectives," Ron S. Kenett (KPA Ltd Management Consulting) and Charles S. Tapiero, Polytechnic Institute of NYU, Brooklyn, New York
4. "Safety and Economic Reliability," Charles S. Tapiero, Polytechnic Institute of NYU, Brooklyn, New York

14. Adaptive Designs in Pharmaceutical Industry
Session Organizer: Mani Y. Lakshminarayanan, Merck
Session Chair: Mani Y. Lakshminarayanan, Merck
1. "Implementation of Adaptive Designs at Merck," Keaven Anderson, Nichole Dossin, Jerry Schindler, Merck
2. "Sample Size Reestimation in Clinical Trials: A Review and Comparison," Yanping Wang, Eli Lilly and Co.
3. "Data combination in seamless Phase II/III designs," Chris Jennison, University of Bath, UK

15. Data Mining and Information Retrieval
Session Organizer: Regina Liu, Rutgers University
Session Chair: Regina Liu, Rutgers University
1. "High-Dimensional Classifiers: The Bayesian Connection," David Madigan, Columbia University
2 "Multiplicity Issue in Confidentiality," Jiashun Jin, Carnegie Mellon University
3 "The role of valid models in data mining," Simon Sheather, Texas A&M University

Special Invited Session #1: Advances in Reliability
Session Organizer: Emmanuel Yashchin, IBM Research
Session Chair: Emmanuel Yashchin, IBM Research
"Step - Stress models and associated inferential issues," N. Balakrishnan, McMaster University, Canada

Special Invited Session #2: Advances in Process Monitoring
Session Organizer: Emmanuel Yashchin, IBM Research
Session Chair: William H. Woodall, Virginia Tech
"Process Monitoring with Supervised Learning and Artificial Contrasts," George Runger, Arizona State University and Eugene Tuv, Intel

16. Special INFORMS Session: Data Mining in Manufacturing Process Control
Session Organizer: Susan Albin, Rutgers University
Session Chair: Susan Albin, Rutgers University
1. "Attribute Control Charts Using Generalized Zero-Inflated Poisson Distribution," Nan Chen and Shiyu Zhou (University of Wisconsin - Madison), Tsyy-Shun Chang and Howard Huang (OG Technologies Inc., Ann Arbor, MI)
2. "Data Mining for Process Monitoring of Semiconductor Manufacturing with Spatial Wafer Map Data," Myong K. Jeong, Young S. Jeong and Seong J. Kim, Rutgers University
3. "Selecting the best variables for classifying production batches into two quality levels," Michel Anzanello, Susan Albin and Wanpracha A. Chaovalitwongse, Rutgers University

17. Nonparametric Statistical Process Control / Monitoring
Session Organizer: Regina Liu, Rutgers University
Session Chair: Regina Liu, Rutgers University
1. "Using the Empirical Probability Integral Transformation to Construct a Nonparametric CUSUM Algorithm," Daniel Jeske, University of California, Riverside
2. "Optimal Sampling in State Space Models with Applications to Network Monitoring," George Michailidis, University of Michigan
3. "Nonparametric Tolerance Regions Based on Multivariate Spacings," Jun Li, University of California, Riverside

18. Statistical Leadership in Industry
Session Organizer: Diane Michelson, Sematech
Session Chair: Diane Michelson, Sematech
1. "Statisticians and Statistical Organizations - How to Be Successful in Today's World?" Ronald D. Snee, Tunnell Consulting
2. "Statistical Leadership at GE," J.D. Williams, GE
3. "Analytics with Commercial Impact: IBM Research Solutions for Microelectronic Manufacturing and Development," Robert Baseman, IBM Research

19. New developments in Design of Experiments
Session Organizer: Douglas C. Montgomery, Arizona State University
Session Chair: Connie Borror, Arizona State University West
1. "Alternatives to Resolution IV Screening Designs in 16 Runs," Bradley Jones, JMP
2. "Dual Response Surface Methods (RSM) to Make Processes More Robust," Mark J. Anderson and Patrick J. Whitcomb, Stat-Ease, Inc.
3. "An Empirical Comparison of Computer Experiments," Rachel T. Johnson, Douglas C. Montgomery (Arizona State University), Bradley Jones, JMP

20. Bayesian methods in Quality and Reliability
Session Organizer: Will Guthrie, NIST
Session Chair: Will Guthrie, NIST
1. "Bayesian SPC for Count Data," Panagiotis Tsiamyrtzis, Athens University of Economics and Business
2. "Integrating Computer and Physical Experiment Data," Brian Williams, Statistical Sciences Group, Los Alamos National Laboratory
3. "Bayesian Design of Reliability Experiments," Yao Zhang, Pfizer

21. Healthcare Applications
Session Organizer: Art Chaovalitwongse, Rutgers University
Session Chair: Art Chaovalitwongse, Rutgers University
1. "Statistical Inference for Ranks of Health Care Facilities in the Presence of Ties and Near Ties," Minge Xie, Rutgers University
2. "Multivariate Time Series Classification for Brain Diagnosis," Art Chaovalitwongse, Rutgers University
3. "Intensity modulation radiation therapy treatment optimization methods for total body irradiation," Dionne Aleman, University of Toronto